LuphoScan is game-changing technology for measuring 3D form

The LUPHOScan HD 850 builds upon the major success of the LUPHOScan 260 and 600 models with superior accuracy, lower noise and exceptional RMS values as low as 5 nanometers. The system is capable of measuring aspheres, diffractives and other more complex free-form surfaces.

Based on a patented interferometric scanning metrology system using multi-wavelength interferometry (MWLI®), the LUPHOScan uses technology to produce exceptional and highly repeatable measurement results.